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OptoScanSummaryFactory Class Reference

#include <OptoScanSummaryFactory.h>

Inheritance diagram for OptoScanSummaryFactory:
SummaryPlotFactory< CommissioningAnalysis * > SummaryPlotFactoryBase

Protected Member Functions

void extract (Iterator)
 
void format ()
 
- Protected Member Functions inherited from SummaryPlotFactoryBase
void fill (TH1 &summary_histo)
 
void init (const sistrip::Monitorable &, const sistrip::Presentation &, const sistrip::View &, const std::string &top_level_dir, const sistrip::Granularity &)
 
 SummaryPlotFactoryBase ()
 
 ~SummaryPlotFactoryBase ()
 

Additional Inherited Members

- Public Types inherited from SummaryPlotFactory< CommissioningAnalysis * >
typedef std::map< uint32_t, CommissioningAnalysis * >::const_iterator Iterator
 
- Public Member Functions inherited from SummaryPlotFactory< CommissioningAnalysis * >
void fill (TH1 &summary_histo)
 
uint32_t init (const sistrip::Monitorable &, const sistrip::Presentation &, const sistrip::View &, const std::string &top_level_dir, const sistrip::Granularity &, const std::map< uint32_t, CommissioningAnalysis * > &data)
 
 SummaryPlotFactory ()
 
virtual ~SummaryPlotFactory ()
 
- Protected Attributes inherited from SummaryPlotFactoryBase
SummaryGeneratorgenerator_
 
sistrip::Granularity gran_
 
std::string level_
 
sistrip::Monitorable mon_
 
sistrip::Presentation pres_
 
sistrip::View view_
 

Detailed Description

Definition at line 6 of file OptoScanSummaryFactory.h.

Member Function Documentation

void OptoScanSummaryFactory::extract ( Iterator  iter)
protectedvirtual

Reimplemented from SummaryPlotFactory< CommissioningAnalysis * >.

Definition at line 12 of file OptoScanSummaryFactory.cc.

References OptoScanAnalysis::bias(), relativeConstraints::error, SummaryGenerator::fillMap(), OptoScanAnalysis::gain(), SummaryPlotFactoryBase::generator_, SummaryPlotFactoryBase::gran_, sistrip::invalid_, SummaryPlotFactoryBase::level_, OptoScanAnalysis::liftOff(), OptoScanAnalysis::linkNoise(), OptoScanAnalysis::measGain(), sistrip::mlSummaryPlots_, SummaryPlotFactoryBase::mon_, SiStripEnumsAndStrings::monitorable(), sistrip::OPTO_SCAN_BASELINE_LIFT_OFF, sistrip::OPTO_SCAN_LASER_THRESHOLD, sistrip::OPTO_SCAN_LINK_NOISE, sistrip::OPTO_SCAN_LLD_BIAS_SETTING, sistrip::OPTO_SCAN_LLD_GAIN_SETTING, sistrip::OPTO_SCAN_MEASURED_GAIN, sistrip::OPTO_SCAN_TICK_HEIGHT, sistrip::OPTO_SCAN_ZERO_LIGHT_LEVEL, OptoScanAnalysis::threshold(), OptoScanAnalysis::tickHeight(), sistrip::valid_, and OptoScanAnalysis::zeroLight().

12  {
13 
14  OptoScanAnalysis* anal = dynamic_cast<OptoScanAnalysis*>( iter->second );
15  if ( !anal ) { return; }
16 
17  uint16_t igain = anal->gain();
18  if ( igain > sistrip::valid_ ) { return; }
19 
20  float value = 1. * sistrip::invalid_;
21  float error = 1. * sistrip::invalid_;
22 
24  value = igain;
26  value = anal->bias()[igain];
28  value = anal->measGain()[igain];
30  value = anal->zeroLight()[igain];
32  value = anal->linkNoise()[igain];
34  value = anal->liftOff()[igain];
36  value = anal->threshold()[igain];
38  value = anal->tickHeight()[igain];
39  } else {
41  << "[SummaryPlotFactory::" << __func__ << "]"
42  << " Unexpected monitorable: "
44  return;
45 
46  }
47 
50  iter->first,
51  value,
52  error );
53 
54 }
Histogram-based analysis for opto bias/gain scan.
const uint16_t & gain() const
static std::string monitorable(const sistrip::Monitorable &)
sistrip::Monitorable mon_
const VFloat & liftOff() const
const VFloat & linkNoise() const
static const uint16_t valid_
Definition: Constants.h:17
const VFloat & measGain() const
const VFloat & tickHeight() const
const VFloat & zeroLight() const
void fillMap(const std::string &top_level_dir, const sistrip::Granularity &, const uint32_t &key, const float &value, const float &error=0.)
Definition: value.py:1
sistrip::Granularity gran_
static const char mlSummaryPlots_[]
const VInt & bias() const
SummaryGenerator * generator_
const VFloat & threshold() const
static const uint16_t invalid_
Definition: Constants.h:16
void OptoScanSummaryFactory::format ( )
protectedvirtual

Reimplemented from SummaryPlotFactory< CommissioningAnalysis * >.

Definition at line 58 of file OptoScanSummaryFactory.cc.

References sistrip::mlSummaryPlots_, SummaryPlotFactoryBase::mon_, SiStripEnumsAndStrings::monitorable(), sistrip::OPTO_SCAN_BASELINE_LIFT_OFF, sistrip::OPTO_SCAN_LASER_THRESHOLD, sistrip::OPTO_SCAN_LINK_NOISE, sistrip::OPTO_SCAN_LLD_BIAS_SETTING, sistrip::OPTO_SCAN_LLD_GAIN_SETTING, sistrip::OPTO_SCAN_MEASURED_GAIN, sistrip::OPTO_SCAN_TICK_HEIGHT, and sistrip::OPTO_SCAN_ZERO_LIGHT_LEVEL.

58  {
59 
68  } else {
70  << "[SummaryPlotFactory::" << __func__ << "]"
71  << " Unexpected SummaryHisto value:"
73  }
74 
75 }
static std::string monitorable(const sistrip::Monitorable &)
sistrip::Monitorable mon_
static const char mlSummaryPlots_[]