1 #ifndef MeasurementTrackerEventProducer_h
2 #define MeasurementTrackerEventProducer_h
25 void getInactiveStrips(
const edm::Event&
event,std::vector<uint32_t> & rawInactiveDetIds)
const;
std::vector< edm::EDGetTokenT< DetIdCollection > > theInactiveStripDetectorLabels
bool selfUpdateSkipClusters_
virtual void produce(Event &, EventSetup const &)=0
How EventSelector::AcceptEvent() decides whether to accept an event for output otherwise it is excluding the probing of A single or multiple positive and the trigger will pass if any such matching triggers are PASS or EXCEPTION[A criterion thatmatches no triggers at all is detected and causes a throw.] A single negative with an expectation of appropriate bit checking in the decision and the trigger will pass if any such matching triggers are FAIL or EXCEPTION A wildcarded negative criterion that matches more than one trigger in the trigger but the state exists so we define the behavior If all triggers are the negative crieriion will lead to accepting the event(this again matches the behavior of"!*"before the partial wildcard feature was incorporated).The per-event"cost"of each negative criterion with multiple relevant triggers is about the same as!*was in the past
const edm::ParameterSet & pset_
edm::EDGetTokenT< edm::ContainerMask< edmNew::DetSetVector< SiPixelCluster > > > thePixelClusterMask
std::string measurementTrackerLabel_
edm::EDGetTokenT< edmNew::DetSetVector< SiStripCluster > > theStripClusterLabel
~MeasurementTrackerEventProducer()
edm::EDGetTokenT< edmNew::DetSetVector< SiPixelCluster > > thePixelClusterLabel
edm::EDGetTokenT< edm::ContainerMask< edmNew::DetSetVector< SiStripCluster > > > theStripClusterMask
std::vector< edm::EDGetTokenT< DetIdCollection > > theInactivePixelDetectorLabels