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EfficiencyAnalyzer.h
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1 #ifndef EFFICIENCYANALYZER_H
2 #define EFFICIENCYANALYZER_H
3 
11 /* Base Class Headers */
12 #include <memory>
13 #include <fstream>
24 
32 
35 
37 
38  public:
39  /* Constructor */
41 
42  /* Destructor */
43  virtual ~EfficiencyAnalyzer() ;
44 
45  /* Operations */
46  void analyze(const edm::Event & event, const edm::EventSetup& eventSetup);
47  void bookHistograms(DQMStore::IBooker &, edm::Run const &, edm::EventSetup const &) override;
48 
49  private:
52 
53  // Switch for verbosity
55 
56  //histo binning parameters
57  int etaBin_;
58  int phiBin_;
59  int ptBin_;
60 
61  double ptMin_;
62  double ptMax_;
63 
64  double etaMin_;
65  double etaMax_;
66 
67  double phiMin_;
68  double phiMax_;
69 
70  int vtxBin_;
71  double vtxMin_;
72  double vtxMax_;
73 
75 
94 
98 
111 
112 
113  // Apply deltaBeta PU corrections to the PF isolation eficiencies.
120 
121  int _numPV;
122 
123  // STA Label
126 
127  //Vertex requirements
131 };
132 #endif
133 
MonitorElement * h_allProbes_ID_nVtx
MonitorElement * h_passProbes_EB_pfIsodBID_nVtx
MonitorElement * h_passProbes_EE_pfIsoID_pt
MonitorElement * h_allProbes_EB_ID_nVtx
MonitorElement * h_passProbes_ID_pt
edm::EDGetTokenT< reco::TrackCollection > theTrackCollectionLabel_
MonitorElement * h_allProbes_eta
MonitorElement * h_failProbes_ID_pt
MonitorElement * h_passProbes_EE_detIsoID_pt
MonitorElement * h_passProbes_ID_eta
edm::ParameterSet parameters
edm::EDGetTokenT< reco::VertexCollection > theVertexLabel_
MonitorElement * h_passProbes_ID_phi
MonitorElement * h_allProbes_EE_ID_nVtx
MonitorElement * h_allProbes_ID_pt
edm::EDGetTokenT< reco::BeamSpot > theBeamSpotLabel_
MonitorElement * h_passProbes_EB_pfIsoID_nVtx
MonitorElement * h_passProbes_pfIsoID_pt
void bookHistograms(DQMStore::IBooker &, edm::Run const &, edm::EventSetup const &) override
MonitorElement * h_allProbes_pt
MonitorElement * h_allProbes_EE_ID_pt
MonitorElement * h_passProbes_pfIsodBID_nVtx
MonitorElement * h_allProbes_EB_pt
MuonServiceProxy * theService
MonitorElement * h_passProbes_EB_pfIsodBID_pt
MonitorElement * h_allProbes_EE_pt
MonitorElement * h_passProbes_pfIsodBID_pt
MonitorElement * h_passProbes_ID_EB_pt
MonitorElement * h_passProbes_ID_hp_eta
How EventSelector::AcceptEvent() decides whether to accept an event for output otherwise it is excluding the probing of A single or multiple positive and the trigger will pass if any such matching triggers are PASS or EXCEPTION[A criterion thatmatches no triggers at all is detected and causes a throw.] A single negative with an expectation of appropriate bit checking in the decision and the trigger will pass if any such matching triggers are FAIL or EXCEPTION A wildcarded negative criterion that matches more than one trigger in the trigger but the state exists so we define the behavior If all triggers are the negative crieriion will lead to accepting the event(this again matches the behavior of"!*"before the partial wildcard feature was incorporated).The per-event"cost"of each negative criterion with multiple relevant triggers is about the same as!*was in the past
MonitorElement * h_passProbes_pfIsoID_nVtx
void analyze(const edm::Event &event, const edm::EventSetup &eventSetup)
MonitorElement * h_passProbes_EE_pfIsodBID_nVtx
MonitorElement * h_passProbes_EE_pfIsoID_nVtx
MonitorElement * h_passProbes_detIsoID_nVtx
MonitorElement * h_passProbes_EB_detIsoID_pt
MonitorElement * h_failProbes_ID_phi
MonitorElement * h_passProbes_EB_detIsoID_nVtx
MonitorElement * h_passProbes_EE_pfIsodBID_pt
MonitorElement * h_allProbes_EB_ID_pt
MonitorElement * h_failProbes_ID_eta
MonitorElement * h_passProbes_detIsoID_pt
MonitorElement * h_passProbes_ID_EE_pt
MonitorElement * h_allProbes_hp_eta
edm::EDGetTokenT< reco::MuonCollection > theMuonCollectionLabel_
MonitorElement * h_passProbes_EE_detIsoID_nVtx
MonitorElement * h_allProbes_phi
MonitorElement * h_passProbes_EB_pfIsoID_pt
EfficiencyAnalyzer(const edm::ParameterSet &pset)
Definition: Run.h:41