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EfficiencyAnalyzer.h
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1 #ifndef EFFICIENCYANALYZER_H
2 #define EFFICIENCYANALYZER_H
3 
11 /* Base Class Headers */
12 #include <memory>
13 #include <fstream>
24 
32 
35 
37 
38  public:
39  /* Constructor */
41 
42  /* Destructor */
43  virtual ~EfficiencyAnalyzer() ;
44 
45  /* Operations */
46  void analyze(const edm::Event & event, const edm::EventSetup& eventSetup);
47  void bookHistograms(DQMStore::IBooker &, edm::Run const &, edm::EventSetup const &) override;
48 
49  private:
52 
53  // Switch for verbosity
55 
56  //histo binning parameters
57  int etaBin_;
58  int phiBin_;
59  int ptBin_;
60 
61  double ptMin_;
62  double ptMax_;
63 
64  double etaMin_;
65  double etaMax_;
66 
67  double phiMin_;
68  double phiMax_;
69 
70  int vtxBin_;
71  double vtxMin_;
72  double vtxMax_;
73 
92 
96 
109 
110 
112 
113  // Apply deltaBeta PU corrections to the PF isolation eficiencies.
120 
121  int _numPV;
122 
123  // STA Label
126 
127  //Vertex requirements
131 };
132 #endif
133 
MonitorElement * h_passProbes_pfIsoTightMu_nVtx
MonitorElement * h_passProbes_EB_pfIsoTightMu_pt
MonitorElement * h_passProbes_EB_pfIsodBTightMu_nVtx
edm::EDGetTokenT< reco::TrackCollection > theTrackCollectionLabel_
MonitorElement * h_failProbes_TightMu_pt
MonitorElement * h_allProbes_eta
MonitorElement * h_allProbes_EE_TightMu_nVtx
edm::ParameterSet parameters
MonitorElement * h_passProbes_EB_detIsoTightMu_pt
edm::EDGetTokenT< reco::VertexCollection > theVertexLabel_
MonitorElement * h_passProbes_pfIsodBTightMu_nVtx
MonitorElement * h_allProbes_EB_TightMu_pt
edm::EDGetTokenT< reco::BeamSpot > theBeamSpotLabel_
MonitorElement * h_passProbes_EE_pfIsoTightMu_nVtx
MonitorElement * h_passProbes_EE_detIsoTightMu_pt
void bookHistograms(DQMStore::IBooker &, edm::Run const &, edm::EventSetup const &) override
MonitorElement * h_allProbes_pt
MonitorElement * h_allProbes_EB_pt
MonitorElement * h_passProbes_TightMu_EB_pt
MonitorElement * h_passProbes_EE_pfIsoTightMu_pt
MonitorElement * h_passProbes_EB_pfIsoTightMu_nVtx
MonitorElement * h_passProbes_TightMu_hp_eta
MuonServiceProxy * theService
MonitorElement * h_allProbes_EE_pt
MonitorElement * h_passProbes_TightMu_eta
MonitorElement * h_passProbes_EE_detIsoTightMu_nVtx
MonitorElement * h_passProbes_TightMu_phi
MonitorElement * h_failProbes_TightMu_phi
MonitorElement * h_passProbes_TightMu_pt
How EventSelector::AcceptEvent() decides whether to accept an event for output otherwise it is excluding the probing of A single or multiple positive and the trigger will pass if any such matching triggers are PASS or EXCEPTION[A criterion thatmatches no triggers at all is detected and causes a throw.] A single negative with an expectation of appropriate bit checking in the decision and the trigger will pass if any such matching triggers are FAIL or EXCEPTION A wildcarded negative criterion that matches more than one trigger in the trigger but the state exists so we define the behavior If all triggers are the negative crieriion will lead to accepting the event(this again matches the behavior of"!*"before the partial wildcard feature was incorporated).The per-event"cost"of each negative criterion with multiple relevant triggers is about the same as!*was in the past
MonitorElement * h_allProbes_EB_TightMu_nVtx
MonitorElement * h_passProbes_TightMu_EE_pt
void analyze(const edm::Event &event, const edm::EventSetup &eventSetup)
MonitorElement * h_passProbes_EB_detIsoTightMu_nVtx
MonitorElement * h_passProbes_EE_pfIsodBTightMu_nVtx
MonitorElement * h_passProbes_EE_pfIsodBTightMu_pt
MonitorElement * h_allProbes_TightMu_pt
MonitorElement * test_TightMu_Minv
MonitorElement * h_passProbes_EB_pfIsodBTightMu_pt
MonitorElement * h_passProbes_detIsoTightMu_nVtx
MonitorElement * h_failProbes_TightMu_eta
MonitorElement * h_allProbes_hp_eta
edm::EDGetTokenT< reco::MuonCollection > theMuonCollectionLabel_
MonitorElement * h_allProbes_EE_TightMu_pt
MonitorElement * h_allProbes_phi
EfficiencyAnalyzer(const edm::ParameterSet &pset)
MonitorElement * h_allProbes_TightMu_nVtx
MonitorElement * h_passProbes_pfIsodBTightMu_pt
MonitorElement * h_passProbes_detIsoTightMu_pt
Definition: Run.h:41
MonitorElement * h_passProbes_pfIsoTightMu_pt