Remove duplicates from the list of electrons. More...
Private Attributes | |
pat::DuplicatedElectronRemover | duplicateRemover_ |
edm::EDGetTokenT< edm::View < reco::GsfElectron > > | electronSrcToken_ |
uint64_t | pass_ |
uint64_t | try_ |
Additional Inherited Members | |
Public Types inherited from edm::EDProducer | |
typedef EDProducer | ModuleType |
Public Types inherited from edm::ProducerBase | |
typedef ProductRegistryHelper::TypeLabelList | TypeLabelList |
Static Public Member Functions inherited from edm::EDProducer | |
static const std::string & | baseType () |
static void | fillDescriptions (ConfigurationDescriptions &descriptions) |
static void | prevalidate (ConfigurationDescriptions &descriptions) |
Protected Member Functions inherited from edm::ProducerBase | |
void | callWhenNewProductsRegistered (std::function< void(BranchDescription const &)> const &func) |
Protected Member Functions inherited from edm::EDConsumerBase | |
template<typename ProductType , BranchType B = InEvent> | |
EDGetTokenT< ProductType > | consumes (edm::InputTag const &tag) |
EDGetToken | consumes (const TypeToGet &id, edm::InputTag const &tag) |
template<BranchType B> | |
EDGetToken | consumes (TypeToGet const &id, edm::InputTag const &tag) |
ConsumesCollector | consumesCollector () |
Use a ConsumesCollector to gather consumes information from helper functions. More... | |
template<typename ProductType , BranchType B = InEvent> | |
void | consumesMany () |
void | consumesMany (const TypeToGet &id) |
template<BranchType B> | |
void | consumesMany (const TypeToGet &id) |
template<typename ProductType , BranchType B = InEvent> | |
EDGetTokenT< ProductType > | mayConsume (edm::InputTag const &tag) |
EDGetToken | mayConsume (const TypeToGet &id, edm::InputTag const &tag) |
template<BranchType B> | |
EDGetToken | mayConsume (const TypeToGet &id, edm::InputTag const &tag) |
Remove duplicates from the list of electrons.
The DuplicatedElectronCleaner removes duplicates from the input collection. Two electrons are considered duplicate if they share the same gsfTrack or the same superCluster. Among the two, the one with |E/P| nearest to 1 is kept. This is performed by the DuplicatedElectronRemover in PhysicsTools/PatUtils
The output is an edm::RefVector<reco:::GsfElectron>, which can be read through edm::View<reco::GsfElectron>
Definition at line 33 of file DuplicatedElectronCleaner.cc.
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explicit |
Definition at line 48 of file DuplicatedElectronCleaner.cc.
pat::DuplicatedElectronCleaner::~DuplicatedElectronCleaner | ( | ) |
Definition at line 57 of file DuplicatedElectronCleaner.cc.
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overridevirtual |
Reimplemented from edm::EDProducer.
Definition at line 87 of file DuplicatedElectronCleaner.cc.
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overridevirtual |
Implements edm::EDProducer.
Definition at line 62 of file DuplicatedElectronCleaner.cc.
References HI_PhotonSkim_cff::electrons, edm::Event::getByToken(), i, n, edm::Event::put(), and query::result.
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private |
Definition at line 43 of file DuplicatedElectronCleaner.cc.
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private |
Definition at line 42 of file DuplicatedElectronCleaner.cc.
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private |
Definition at line 44 of file DuplicatedElectronCleaner.cc.
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private |
Definition at line 44 of file DuplicatedElectronCleaner.cc.