#include "SiStripDetInfo.h"
Classes | |
struct | DetInfo |
Public Member Functions | |
const std::map< uint32_t, DetInfo > & | getAllData () const noexcept |
const std::vector< uint32_t > & | getAllDetIds () const noexcept |
const std::pair< unsigned short, double > | getNumberOfApvsAndStripLength (uint32_t detId) const |
const float & | getThickness (uint32_t detId) const |
SiStripDetInfo & | operator= (const SiStripDetInfo &)=default |
SiStripDetInfo & | operator= (SiStripDetInfo &&)=default |
SiStripDetInfo (std::map< uint32_t, DetInfo > iDetData, std::vector< uint32_t > iIDs) noexcept | |
SiStripDetInfo ()=default | |
SiStripDetInfo (const SiStripDetInfo &)=default | |
SiStripDetInfo (SiStripDetInfo &&)=default | |
~SiStripDetInfo ()=default | |
Private Attributes | |
std::map< uint32_t, DetInfo > | detData_ |
std::vector< uint32_t > | detIds_ |
Description: [one line class summary]
Usage: <usage>
Definition at line 29 of file SiStripDetInfo.h.
|
inlinenoexcept |
|
default |
|
default |
|
default |
|
default |
|
inlinenoexcept |
Definition at line 59 of file SiStripDetInfo.h.
References detData_.
Referenced by SiStripQuality::addNotConnectedConnectionFromCabling(), SiStripCondObjBuilderFromDb::buildAnalysisRelatedObjects(), SiStripGain::fillNewGain(), SiStripApvGainFakeESSource::produce(), SiStripThresholdFakeESSource::produce(), SiStripLatencyFakeESSource::produce(), SiStripBaseDelayFakeESSource::produce(), SiStripPedestalsFakeESSource::produce(), and SiStripNoisesFakeESSource::produce().
|
inlinenoexcept |
Definition at line 53 of file SiStripDetInfo.h.
References detIds_.
Referenced by SiStripBaseCondObjDQM::analysis(), SiStripFedCablingFakeESSource::make(), SiStripBadModuleConfigurableFakeESSource::produce(), and SiStripQualityStatistics::updateAndSave().
const std::pair< unsigned short, double > SiStripDetInfo::getNumberOfApvsAndStripLength | ( | uint32_t | detId | ) | const |
Definition at line 19 of file SiStripDetInfo.cc.
References detData_.
Referenced by SiStripQuality::add(), SiStripHitEffFromCalibTree::algoAnalyze(), OverlapValidation::analyzeTrajectory(), SiStripBaseCondObjDQM::bookProfileMEs(), SiStripBaseCondObjDQM::bookSummaryProfileMEs(), SiStripQuality::compact(), SiStripQuality::difference(), SiStripQuality::fillBadComponents(), SiStripThresholdDQM::fillMEsForDet(), SiStripThresholdDQM::fillMEsForLayer(), SiStripBadChannelBuilder::getNewObject(), SiStripFedCablingFakeESSource::make(), SiStripHitEffFromCalibTree::makeSQLite(), SiStripBadModuleConfigurableFakeESSource::produce(), SiStripCondObjBuilderFromDb::retrieveNumberAPVPairs(), SiStripQualityStatistics::SetBadComponents(), SiStripHitEffFromCalibTree::SetBadComponents(), SiStripCondObjBuilderFromDb::setValuesApvLatency(), and SiStripQualityStatistics::updateAndSave().
const float & SiStripDetInfo::getThickness | ( | uint32_t | detId | ) | const |
Definition at line 35 of file SiStripDetInfo.cc.
References detData_.
|
default |
|
default |
|
private |
Definition at line 67 of file SiStripDetInfo.h.
Referenced by getAllData(), getNumberOfApvsAndStripLength(), and getThickness().
|
private |
Definition at line 68 of file SiStripDetInfo.h.
Referenced by getAllDetIds().