#include <OptoScanSummaryFactory.h>
Protected Member Functions | |
void | extract (Iterator) override |
void | format () override |
Protected Member Functions inherited from SummaryPlotFactoryBase | |
void | fill (TH1 &summary_histo) |
void | init (const sistrip::Monitorable &, const sistrip::Presentation &, const sistrip::View &, const std::string &top_level_dir, const sistrip::Granularity &) |
SummaryPlotFactoryBase () | |
~SummaryPlotFactoryBase () | |
Additional Inherited Members | |
Public Types inherited from SummaryPlotFactory< CommissioningAnalysis * > | |
typedef std::map< uint32_t, CommissioningAnalysis * >::const_iterator | Iterator |
Public Member Functions inherited from SummaryPlotFactory< CommissioningAnalysis * > | |
void | fill (TH1 &summary_histo) |
uint32_t | init (const sistrip::Monitorable &, const sistrip::Presentation &, const sistrip::View &, const std::string &top_level_dir, const sistrip::Granularity &, const std::map< uint32_t, CommissioningAnalysis * > &data) |
SummaryPlotFactory () | |
virtual | ~SummaryPlotFactory () |
Protected Attributes inherited from SummaryPlotFactoryBase | |
SummaryGenerator * | generator_ |
sistrip::Granularity | gran_ |
std::string | level_ |
sistrip::Monitorable | mon_ |
sistrip::Presentation | pres_ |
sistrip::View | view_ |
Definition at line 6 of file OptoScanSummaryFactory.h.
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overrideprotectedvirtual |
Reimplemented from SummaryPlotFactory< CommissioningAnalysis * >.
Definition at line 12 of file OptoScanSummaryFactory.cc.
References OptoScanAnalysis::bias(), relativeConstraints::error, SummaryGenerator::fillMap(), OptoScanAnalysis::gain(), SummaryPlotFactoryBase::generator_, SummaryPlotFactoryBase::gran_, sistrip::invalid_, SummaryPlotFactoryBase::level_, OptoScanAnalysis::liftOff(), OptoScanAnalysis::linkNoise(), OptoScanAnalysis::measGain(), sistrip::mlSummaryPlots_, SummaryPlotFactoryBase::mon_, SiStripEnumsAndStrings::monitorable(), sistrip::OPTO_SCAN_BASELINE_LIFT_OFF, sistrip::OPTO_SCAN_LASER_THRESHOLD, sistrip::OPTO_SCAN_LINK_NOISE, sistrip::OPTO_SCAN_LLD_BIAS_SETTING, sistrip::OPTO_SCAN_LLD_GAIN_SETTING, sistrip::OPTO_SCAN_MEASURED_GAIN, sistrip::OPTO_SCAN_TICK_HEIGHT, sistrip::OPTO_SCAN_ZERO_LIGHT_LEVEL, OptoScanAnalysis::threshold(), OptoScanAnalysis::tickHeight(), sistrip::valid_, and OptoScanAnalysis::zeroLight().
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overrideprotectedvirtual |
Reimplemented from SummaryPlotFactory< CommissioningAnalysis * >.
Definition at line 58 of file OptoScanSummaryFactory.cc.
References sistrip::mlSummaryPlots_, SummaryPlotFactoryBase::mon_, SiStripEnumsAndStrings::monitorable(), sistrip::OPTO_SCAN_BASELINE_LIFT_OFF, sistrip::OPTO_SCAN_LASER_THRESHOLD, sistrip::OPTO_SCAN_LINK_NOISE, sistrip::OPTO_SCAN_LLD_BIAS_SETTING, sistrip::OPTO_SCAN_LLD_GAIN_SETTING, sistrip::OPTO_SCAN_MEASURED_GAIN, sistrip::OPTO_SCAN_TICK_HEIGHT, and sistrip::OPTO_SCAN_ZERO_LIGHT_LEVEL.